DocumentCode
3128791
Title
Polymeric integrated circuits: fabrication and first characterisation
Author
de Leeuw, D.M. ; Gelinck, G.H. ; Geuns, T.C.T. ; van Veenendaal, E. ; Cantatore, E. ; Huisman, B.H.
Author_Institution
Philips Res. Lab., Eindhoven, Netherlands
fYear
2002
fDate
8-11 Dec. 2002
Firstpage
293
Lastpage
296
Abstract
A technology to fabricate polymeric integrated circuits on 150-mm foils is presented. The technology is demonstrated with functional code generators. The integration level is about 700 transistors. The yield of the circuits has been measured as function of the complexity and has been correlated with intrinsic noise margin of the logic gates.
Keywords
foils; integrated circuit noise; integrated circuit technology; integrated circuit yield; polymers; 150 mm; circuit complexity; circuit yield; fabrication technology; functional code generator; intrinsic noise margin; logic gate; polymer foil; polymeric integrated circuit; Electrodes; FETs; Fabrication; Gold; Integrated circuit technology; Integrated circuit yield; Laboratories; Pentacene; Polymers; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2002. IEDM '02. International
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-7462-2
Type
conf
DOI
10.1109/IEDM.2002.1175836
Filename
1175836
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