DocumentCode
3129678
Title
Two level, in-band/out-of-band modelling RF interference effects in integrated circuits and electronic systems
Author
Whyman, N.L. ; Dawson, J.F.
Author_Institution
DERA, Farnborough, UK
fYear
1999
fDate
1999
Firstpage
135
Lastpage
140
Abstract
We present a new behavioural model that combines high frequency and low frequency subcircuits to predict the effect of radio frequency interference (RFI) on linear integrated circuits. The model is constructed from measured and manufacturers data, and can determine the failure mechanisms in analogue systems subjected to RFI. The results of measurements and simulations of circuits containing one and two op-amps demonstrate the principle of the model
Keywords
analogue integrated circuits; RF interference effects; RFI; analogue systems; behavioural model; electronic systems; failure mechanisms; high frequency subcircuits; in-band/out-of-band modelling; integrated circuits; linear integrated circuits; low frequency subcircuits; manufacturers data; measured data; op-amps; radio frequency interference; simulations; two level modelling;
fLanguage
English
Publisher
iet
Conference_Titel
Electromagnetic Compatibility, 1999. EMC York 99. International Conference and Exhibition on (Conf. Publ. No. 464)
Conference_Location
York
ISSN
0537-9989
Print_ISBN
0-85296-716-0
Type
conf
DOI
10.1049/cp:19990258
Filename
791041
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