DocumentCode
3131162
Title
Multiple Probe Interactions in Near-field Imaging
Author
Carney, P. Scott ; Sun, Jin ; Schotland, John C.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL
fYear
2006
fDate
Oct. 2006
Firstpage
691
Lastpage
692
Abstract
We consider effects of a strongly scattering tip in near-field scanning optical microscopy. It is shown that multiple tip-substrate interactions have a dramatic effect on the spectroscopic response of the instrument with important implications for the solution of the inverse scattering problem
Keywords
inverse problems; light scattering; near-field scanning optical microscopy; probes; inverse scattering problem; multiple probe interactions; near-field scanning optical microscopy; spectroscopic response; Apertures; Biomedical optical imaging; Inverse problems; Lighting; Optical imaging; Optical microscopy; Optical scattering; Probes; Spatial resolution; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2006. LEOS 2006. 19th Annual Meeting of the IEEE
Conference_Location
Montreal, Que.
Print_ISBN
0-7803-9555-7
Electronic_ISBN
0-7803-9555-7
Type
conf
DOI
10.1109/LEOS.2006.278901
Filename
4054372
Link To Document