DocumentCode
3131549
Title
Diagnosis with convolutional compactors in presence of unknown states
Author
Mrugalski, Grzegorz ; Pogiel, Artur ; Rajski, Janusz ; Tyszer, Jerzy
Author_Institution
Mentor Graphics Corp., Wilsonville, OR
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
404
Abstract
The paper presents non-adaptive fault diagnosis techniques for scan-based designs. These schemes guarantee accurate and time-efficient identification of failing scan cells based on results of a convolutional test response compaction in the presence of unknown states
Keywords
boundary scan testing; convolution; fault diagnosis; convolutional compactors; nonadaptive fault diagnosis; scan-based designs; test response compaction; unknown states; Built-in self-test; Circuit faults; Circuit testing; Compaction; Convolution; Convolutional codes; Cost function; Fault diagnosis; Graphics; Logic testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1583998
Filename
1583998
Link To Document