• DocumentCode
    3132067
  • Title

    Effect of lead free solders on in-circuit test process

  • Author

    Reinosa, Rosa D.

  • Author_Institution
    Hewlett-Packard Co., Palo Alto, CA
  • fYear
    2005
  • fDate
    8-8 Nov. 2005
  • Lastpage
    643
  • Abstract
    In response to the European Union Restriction of Hazardous Substances (RoHS) Directive which bans the use of lead in electronic equipment by July 1, 2006, the selection and use of new lead free solder alloys for the manufacturability of PCAs (printed circuit assemblies) are now requirements faced by many OEMs. HP´s transition to lead free manufacturing requires that the contact repeatability performance of lead free materials be assessed to ensure that the throughput of production lines or yields are not be affected during this transition. In-circuit test probe contact repeatability performance is presented for various lead free material combinations (paste, surface finish) and their impact on production test
  • Keywords
    hazardous materials; printed circuit manufacture; printed circuit testing; probes; production testing; solders; OEM; PCA; RoHS; contact repeatability performance; electronic equipment; in-circuit test process; lead free manufacturing; lead free materials; lead free solders; printed circuit assemblies; production test; Assembly; Circuit testing; Electronic equipment; Electronic equipment manufacture; Environmentally friendly manufacturing techniques; Lead; Materials testing; Principal component analysis; Printed circuits; Production;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2005. Proceedings. ITC 2005. IEEE International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-9038-5
  • Type

    conf

  • DOI
    10.1109/TEST.2005.1584025
  • Filename
    1584025