• DocumentCode
    3132752
  • Title

    Application of viscoelastic model for simulating process-induced warpage of ball grid array packages

  • Author

    Gung, J.-L. ; Huang, H.-W. ; Chiu, T.-C. ; Lai, Y.-S.

  • Author_Institution
    Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2009
  • fDate
    21-23 Oct. 2009
  • Firstpage
    6
  • Lastpage
    9
  • Abstract
    Warpage evolution of an overmolded BGA package either under uniform temperature excursion or during post-mold curing process is analyzed by using finite element simulation with a cure-dependent viscoelastic model for the molding compound. Additional finite element analyses are performed to compare molding compound constitutive behavior (temperature-dependent elastic or viscoelastic) on the package warpage prediction. Through shadow Moire¿ experimental validation, it is observed that the prediction with viscoelastic constitutive model agrees well to the measured values; while the elastic model overestimates package warpage.
  • Keywords
    ball grid arrays; finite element analysis; moire fringes; viscoelasticity; ball grid array packages; finite element simulation; post-mold curing process; process-induced warpage; shadow Moire experimental validation; uniform temperature excursion; viscoelastic model; Elasticity; Electronics packaging; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference, 2009. IMPACT 2009. 4th International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4341-3
  • Electronic_ISBN
    978-1-4244-4342-0
  • Type

    conf

  • DOI
    10.1109/IMPACT.2009.5382296
  • Filename
    5382296