• DocumentCode
    31329
  • Title

    The Search for a Reliable MEMS Switch

  • Author

    Rebeiz, Gabriel M. ; Patel, C.D. ; Han, S.K. ; Chih-Hsiang Ko ; Ho, K.M.J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
  • Volume
    14
  • Issue
    1
  • fYear
    2013
  • fDate
    Jan.-Feb. 2013
  • Firstpage
    57
  • Lastpage
    67
  • Abstract
    The RF community has long been searching for the ideal switch since the birth of electronics, and it is defined as a device having virtually no insertion loss (Ron = 0 Ω) over a wide frequency range, very high isolation [off-state capacitance (Coff)] = 0 fF), extremely high linearity (IIP2 and IIP3 → infinite), medium- to high-power handling (100 mW to 1 kW), and no dc power consumption. Our entire RF infrastructure ecosystem, from communication system networks, to satellite systems, to wideband spectral analysis, to instrumentation and radar systems, uses a variety of switches for signal routing and control (attenuation, phase shifting, etc.). The ideal switch was achieved long time ago using electromechanical relays, and even after nearly 100 years, it is still the best RF switch ever made from an electrical perspective [1]. It has very low insertion loss (Ron <;1 Ω), very high isolation (Coff of few fF), very high linearity and high power handling (100 mW to 50 W). However, it is bulky, expensive, and has an average lifetime of few million cycles.
  • Keywords
    broadband networks; ecology; electromechanical effects; isolation technology; microrelays; power consumption; radar; satellite communication; spectral analysis; RF community; RF infrastructure ecosystem; RF switch; communication system networks; electrical perspective; electromechanical relays; high power handling; medium-to-high-power handling; power 100 mW to 1 kW; power 100 mW to 50 W; radar systems; reliable MEMS switch; resistance 1 ohm; satellite systems; signal routing; very high isolation; very high linearity; very low insertion loss; wide frequency range; wideband spectral analysis; Metals; Micromechanical devices; Microswitches; Packaging; Radio frequency; Switching systems;
  • fLanguage
    English
  • Journal_Title
    Microwave Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1527-3342
  • Type

    jour

  • DOI
    10.1109/MMM.2012.2226540
  • Filename
    6421098