DocumentCode
3133021
Title
A test point selection method for data converters using Rademacher functions and wavelet transforms
Author
Carter, Chandra ; Ang, Simon
Author_Institution
Texas Instruments Inc., Dallas, TX
fYear
2005
fDate
8-8 Nov. 2005
Lastpage
1201
Abstract
A new test method of linearity errors for data converters is presented. Based in principle of the test point selection (NIST) method, this test method combines Rademacher functions and wavelet transforms to create a linearity error model for the data converter. Test results from an analog-to-digital converter and a digital-to-analog converter are presented and compared to other reported methods
Keywords
analogue-digital conversion; digital-analogue conversion; integrated circuit modelling; wavelet transforms; Rademacher functions; analog-to-digital converter; data converters; digital-to-analog converter; linearity error model; test point selection method; wavelet transforms; Analog-digital conversion; Circuits; Instruments; Linearity; NIST; Predictive models; Signal resolution; Testing; Vectors; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Conference_Location
Austin, TX
Print_ISBN
0-7803-9038-5
Type
conf
DOI
10.1109/TEST.2005.1584087
Filename
1584087
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