Position statement: "have we overcome the challenges associated with SoC and multi-core testing?"

Summary form only given. One of the challenges with testing multiple identical cores is minimizing test time. The obvious approach to the problem is to apply scan test patterns in parallel to the identical cores. For AMD, test time is critical so scan is made to go as wide and fast as is practical. Scan compression alone is not sufficient to achieve our scan test time goals. Distributing the scan inputs to the cores isn´t difficult, but effectively observing the scan outputs is much more challenging