DocumentCode
3133998
Title
Applying multi-channel sampling to one-comparator counter-based sampling to enhance system robustness
Author
Hwu, K.I. ; Yau, Y.T.
Author_Institution
Dept. of Electr. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
fYear
2010
fDate
15-17 June 2010
Firstpage
516
Lastpage
520
Abstract
In this paper, the proposed multi-channel sampling technique is applied to the one-comparator counter-based sampling so as to make the system more robust than ever. Without changing any circuit structure, this is experimentally demonstrated by some gain margins of Bode plots.
Keywords
Bode diagrams; analogue-digital conversion; comparators (circuits); Bode plots; circuit structure; multichannel sampling; one-comparator counter-based sampling; system robustness; Delay lines; Field programmable gate arrays; Frequency; Logic devices; Operational amplifiers; Robustness; Sampling methods; Signal sampling; Voltage; Voltage-controlled oscillators; counter-based; multi-channel sampling; one-comparator; robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
Conference_Location
Taichung
Print_ISBN
978-1-4244-5045-9
Electronic_ISBN
978-1-4244-5046-6
Type
conf
DOI
10.1109/ICIEA.2010.5517108
Filename
5517108
Link To Document