• DocumentCode
    3135097
  • Title

    Impact of electron-phonon transport on the thermal resistance of metal-nonmetal interfaces

  • Author

    Goicochea, Javier V. ; Michel, Bruno

  • Author_Institution
    Zurich Res. Lab., IBM Res. GmbH, Rüschlikon, Switzerland
  • fYear
    2011
  • fDate
    20-24 March 2011
  • Firstpage
    155
  • Lastpage
    160
  • Abstract
    In this work, we study the impact of the phonon thermal conductivity of Silver (Ag) and Gold (Au) on the interface resistance of metal-nonmetal contacts at room temperature. The thermal conductivity of both metals is determined for bulk and thin films of varying thickness using non-equilibrium molecular dynamics (NEMD) simulations. Likewise, we determine the thermal interface resistance due to phonons of metal films embedded in a nonmetal layer composed of Silicon (Si). Based on a two-temperature model (TTM) for electrons and phonons, we determine the thermal resistance due to electron-phonon interactions and the variation of the film resistance of Ag and Au layers as a function of their thickness. The latter considering the estimated phonon contribution to the thermal conductivity of the studied metals obtained with our NEMD simulations. Two important results are presented in this work. First, we have found for the studied metals that at room temperature phonons contribute less than 1.0 % to the bulk thermal conductivity; and that their relative contribution to the conductivity and its variation with the film thickness significantly impacts the overall film resistance of metallic films.
  • Keywords
    electron-phonon interactions; gold; molecular dynamics method; silver; thermal conductivity; thin films; Ag; Au; bulk thermal conductivity; electron-phonon interactions; electron-phonon transport; film resistance; gold; metal films; metal-nonmetal contact interface resistance; metal-nonmetal interfaces; nonequilibrium molecular dynamics simulations; nonmetal layer; phonon contribution; phonon thermal conductivity; phonons; silicon; silver; temperature 293 K to 298 K; thermal interface resistance; thin films; Conductivity; Films; Metals; Phonons; Thermal conductivity; Thermal resistance; MD; Molecular dynamics; electron; gold; interface conductance; interface resistance; metal; phonon; silver; thermal conductivity; two-temperature model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-61284-740-5
  • Type

    conf

  • DOI
    10.1109/STHERM.2011.5767193
  • Filename
    5767193