DocumentCode
3135515
Title
Thermal imaging of encapsulated LEDs
Author
Kendig, Dustin ; Yazawa, Kazuaki ; Shakouri, Ali
Author_Institution
Microsanj, Cupertino, CA, USA
fYear
2011
fDate
20-24 March 2011
Firstpage
310
Lastpage
313
Abstract
Thermoreflectance imaging is used to obtain 2D temperature maps of encapsulated LED arrays and elements with sub-micron spatial resolution. Typical LED encapsulation is opaque for infrared light, which prevents direct measurement of the semiconductor die with infrared cameras and thermocouples. A lock-in transient imaging technique with a megapixel silicon CCD is used to obtain the thermoreflectance and electroluminescence signals simultaneously. Transient thermal response in different locations of the die is characterized. Different thermal time constants are observed which correspond to various heat transfer mechanisms.
Keywords
CCD image sensors; electroluminescence; encapsulation; heat transfer; infrared imaging; light emitting diodes; thermocouples; thermoreflectance; 2D temperature maps; electroluminescence signals; encapsulated LED arrays; heat transfer; infrared cameras; infrared light; lock-in transient imaging; megapixel silicon CCD; semiconductor die; sub-micron spatial resolution; thermal imaging; thermocouples; thermoreflectance imaging; transient thermal response; Electroluminescence; Imaging; Light emitting diodes; Reflectivity; Semiconductor device measurement; Temperature measurement; Transient analysis; LED; Thermoreflectance; heating; reliability; thermography;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-61284-740-5
Type
conf
DOI
10.1109/STHERM.2011.5767216
Filename
5767216
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