• DocumentCode
    3135515
  • Title

    Thermal imaging of encapsulated LEDs

  • Author

    Kendig, Dustin ; Yazawa, Kazuaki ; Shakouri, Ali

  • Author_Institution
    Microsanj, Cupertino, CA, USA
  • fYear
    2011
  • fDate
    20-24 March 2011
  • Firstpage
    310
  • Lastpage
    313
  • Abstract
    Thermoreflectance imaging is used to obtain 2D temperature maps of encapsulated LED arrays and elements with sub-micron spatial resolution. Typical LED encapsulation is opaque for infrared light, which prevents direct measurement of the semiconductor die with infrared cameras and thermocouples. A lock-in transient imaging technique with a megapixel silicon CCD is used to obtain the thermoreflectance and electroluminescence signals simultaneously. Transient thermal response in different locations of the die is characterized. Different thermal time constants are observed which correspond to various heat transfer mechanisms.
  • Keywords
    CCD image sensors; electroluminescence; encapsulation; heat transfer; infrared imaging; light emitting diodes; thermocouples; thermoreflectance; 2D temperature maps; electroluminescence signals; encapsulated LED arrays; heat transfer; infrared cameras; infrared light; lock-in transient imaging; megapixel silicon CCD; semiconductor die; sub-micron spatial resolution; thermal imaging; thermocouples; thermoreflectance imaging; transient thermal response; Electroluminescence; Imaging; Light emitting diodes; Reflectivity; Semiconductor device measurement; Temperature measurement; Transient analysis; LED; Thermoreflectance; heating; reliability; thermography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2011 27th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-61284-740-5
  • Type

    conf

  • DOI
    10.1109/STHERM.2011.5767216
  • Filename
    5767216