Study of high-speed loading machine´s missing chip detection system based on vacuum testing

A method of missing chip detection based on vacuum testing is presented in the paper in view of the requirement of response time in high-speed loading machine. On the basis of analyzing the factors that influence response time in theoretical, the experimental platform of the detection system is set up. Some key factors that affect the response time are analyzed by experiments, and the improvement of experimental platform completed in final. The experimental results show that the improved detection system has faster response time on the basis of guaranteeing the stability, the response time of this system is about 38ms, and it has put into use.