DocumentCode
3139244
Title
Morphotropic phase boundary and microstructure of low-temperature sintered PZT ceramics with BiFeO3 and Ba(Cu0.5W 0.5)O3
Author
Murakami, Kenji ; Okada, Nagaya ; Dong, Dunzhuo ; Kaneko, Shoji
Author_Institution
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
fYear
1991
fDate
33457
Firstpage
19
Lastpage
20
Abstract
The sintering temperature of the 0.5 wt% MnO2-added Pb(Zr0.53Ti0.47)O3 ceramics was successfully lowered down to 935°C by the addition of the complex oxides, BiFeO3 and Ba(Cu0.5W0.5)O3 . This addition may cause a shift of the morphotropic phase boundary (MPB) at which the Pb(Zr,Ti)O3 ceramics shows excellent piezoelectric and dielectric properties. Indeed, the XRD studies reveal that the MPB of the ceramics with additives shifts toward the Ti-rich composition. Thus, the electrical properties are affected by this shift of the MPB and the optimum Zr/Ti ratio of 52/48 is determined. Furthermore, the microstructural analyses by using SEM indicate that the additives seem to form stable grain boundaries and the most stable boundaries are obtained with the corresponding composition
Keywords
X-ray diffraction; barium compounds; bismuth compounds; ceramics; grain boundaries; lead compounds; manganese compounds; optical susceptibility; piezoceramics; scanning electron microscopy; sintering; 935 degC; PZT-MnO2-BaCu0.5W0.5O3; PZT-MnO2-BiFeO3; PbZrO3TiO3-MnO2-BaCu0.5W0.5O3; PbZrO3TiO3-MnO2-BiFeO3; SEM; Ti-rich composition; Zr/Ti ratio; ceramics; dielectric susceptibility; ferroelectric; microstructure; morphotropic phase boundary; piezoelectric properties; sintering temperature; stable grain boundaries; Additives; Ceramics; Dielectrics; Grain boundaries; Lattices; Materials science and technology; Microstructure; Scanning electron microscopy; Temperature; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Conference_Location
University Park, PA
Print_ISBN
0-7803-1847-1
Type
conf
DOI
10.1109/ISAF.1994.522287
Filename
522287
Link To Document