• DocumentCode
    3141370
  • Title

    Using Error Latch Trace to Obtain Diagnostic Information

  • Author

    Almy, Paul M. ; Rivero, Jose L.

  • Author_Institution
    IBM Corporation, Endicott, NY
  • fYear
    1981
  • fDate
    29-1 June 1981
  • Firstpage
    355
  • Lastpage
    359
  • Abstract
    An important part of the total job required for designing and building computers is the error detection and diagnostic process. This paper explains the Error Latch Trace (ELT) Program developed at the IBM Laboratory in Endicott, N.Y. It describes a process and a method for automatically obtaining diagnostic error domains from the design data base. The ELT process provides the diagnostic group a key step toward full use of Design Automation.
  • Keywords
    Buildings; Computer errors; Design automation; Design engineering; Error analysis; Failure analysis; Job design; Large scale integration; Latches; Logic design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1981. 18th Conference on
  • Type

    conf

  • DOI
    10.1109/DAC.1981.1585381
  • Filename
    1585381
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3141370