• DocumentCode
    3142278
  • Title

    Equivalent circuit modeling of active frequency selective surfaces

  • Author

    Chang, Kihun ; Kwak, Sang Il ; Yoon, Young Joong

  • Author_Institution
    Yonsei Univ., Seoul
  • fYear
    2008
  • fDate
    22-24 Jan. 2008
  • Firstpage
    663
  • Lastpage
    666
  • Abstract
    In this paper, active frequency selective surfaces (FSS) with squared aperture with loading are described. Active FSS elements using switched PIN diodes are discussed. The unit cell consists of a square aperture element with a metal island loading and one PIN diode placed at the upper gap considering the vertical polarization. The electromagnetic properties of the active FSS structure are changed by applying a dc bias to the substrate, and estimated by the equivalent circuit model of FSS structure and PIN diode. This active FSS design enables transmission to be switched on or off at 2.3 GHz, providing high transmission when the diodes are in off state and high isolation when the diodes are on. Equivalent circuit in the structure is investigated by analyzing transmission and reflection spectra. Measurements on active FSS are compared with numerical calculation based on the scattering matrix formalism. The origin of experimentally observed frequency responses will be scrutinized.
  • Keywords
    equivalent circuits; frequency selective surfaces; matrix algebra; p-i-n diodes; active frequency selective surface; electromagnetic property; equivalent circuit modeling; frequency 2.3 GHz; scattering matrix formalism; square aperture element; switched PIN diode; Apertures; Capacitance; Conducting materials; Dielectric substrates; Equivalent circuits; Frequency estimation; Frequency selective surfaces; Inductors; Reflection; Semiconductor diodes; PIN diode; active FSS; equivalent circuit modeling; frequency selective surfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio and Wireless Symposium, 2008 IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-1462-8
  • Electronic_ISBN
    978-1-4244-1463-5
  • Type

    conf

  • DOI
    10.1109/RWS.2008.4463579
  • Filename
    4463579