DocumentCode
3144095
Title
Testing Functional Faults in VLSI
Author
Min, Yinghua ; Su, Stephen Y H
Author_Institution
China Academy of Railway Sciences, Beijing, China
fYear
1982
fDate
14-16 June 1982
Firstpage
384
Lastpage
392
Abstract
Functional testing has become increasingly important due to the advent of VLSI technology. This paper presents a systematic procedure for generating tests for detecting functional faults in digital systems described by the register transfer language. Procedures for testing register decoding, instruction decoding, data transfer, data storage and data manipulation function faults in microprocessors are described step-by-step. Examples are given to illustrate the procedures.
Keywords
Circuit faults; Circuit testing; Computer science; Decoding; Digital systems; Fault detection; Microprocessors; Registers; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1982. 19th Conference on
Conference_Location
Las Vegas, NV, USA
ISSN
0146-7123
Print_ISBN
0-89791-020-6
Type
conf
DOI
10.1109/DAC.1982.1585528
Filename
1585528
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