DocumentCode
3146413
Title
Diagnosis of TCM Failures in the IBM 3081 Processor Complex
Author
Tendolkar, Nandakumar N.
Author_Institution
International Business Machines Corporation, Poughkeepsie, NY
fYear
1983
fDate
27-29 June 1983
Firstpage
196
Lastpage
200
Abstract
The concepts of automated diagnostics that were developed for and that are implemented in the IBM 3081 Processor complex are presented in this paper. Significant features of the 3081 diagnostics methodology are the capability to isolate intermittent as well as solid hardware failures and the automatic isolation of a failure to the failing field-replaceable unit (FRU) in a high percentage of the cases. The problem of isolating intermittent faults is solved by a new strategy of dynamic error detection and fault isolation by analysis of data captured at the detection of the error.
Keywords
Circuit faults; Condition monitoring; Control systems; Data analysis; Error correction; Fault detection; Hardware; Logic arrays; Process control; Solids;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1983. 20th Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0026-8
Type
conf
DOI
10.1109/DAC.1983.1585648
Filename
1585648
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