DocumentCode
3147974
Title
Proton irradiation of SRAM at SATURNE: results and conclusions about the experiment
Author
Mijuin, D. ; Simon, E. ; Buisson, J. ; Brunet, J.P. ; Murat, J. ; Chapuis, T. ; Milleret, G.
Author_Institution
CEA/DTA/LETI/DEIN/SIR CENS, Gif-sur-Yvette, France
fYear
1991
fDate
9-12 Sep 1991
Firstpage
563
Lastpage
568
Abstract
The authors are studying the behaviour of electronic components submitted to the type of radiations encountered by satellites in orbits or by planetary probes. To simulate the effects of protons, an experimental line to irradiate electronic components has been set up at the SATURNE synchrotron. After a short description of the experiment, the results of the last test campaigns are presented. A method to valid the experimental results is also proposed
Keywords
CMOS integrated circuits; SRAM chips; integrated circuit testing; proton effects; 100 to 800 MeV; 50 to 200 MeV; CMOS; SATURNE synchrotron; SEU testing; SRAM; effects of protons; electronic components; space environment testing; upset cross-section; Cams; Collaboration; Electronic components; Electronic equipment testing; Energy measurement; Protons; Pulse measurements; Random access memory; Synchrotrons; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
Conference_Location
La Grande-Motte
Print_ISBN
0-7803-0208-7
Type
conf
DOI
10.1109/RADECS.1991.213537
Filename
213537
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