• DocumentCode
    3148353
  • Title

    Model order reduction of on-chip interconnects

  • Author

    Medhat, Dina ; Hegazi, Emad ; Abdel-Rahman, Mohamed

  • Author_Institution
    Mentor Graphics, Cairo, Egypt
  • fYear
    2009
  • fDate
    14-16 Dec. 2009
  • Firstpage
    205
  • Lastpage
    210
  • Abstract
    In this paper, we describe a methodology for the efficient extraction and model order reduction of large on-chip interconnects. We propose a methodology that results in simulation time reduction by at least an order of magnitude, compared to commercial model order reduction software, by adopting frequency domain vector fitting to reduce the number of poles required to represent the interconnect. The proposed methodology supports multi-port order reduction while assuring passivity of the resulting reduced network. We verify the proposed methodology on an LC voltage controlled oscillator implemented in CMOS technology and extracting parasitic resistances, capacitances, and inductances. Moreover we verify the proposed methodology on a memory design.
  • Keywords
    CMOS integrated circuits; RLC circuits; integrated circuit interconnections; network analysis; reduced order systems; voltage-controlled oscillators; CMOS technology; LC voltage controlled oscillator; capacitance extraction; frequency domain vector fitting; inductance; large on-chip interconnects; memory design; model order reduction; multi-port order reduction; parasitic resistance extraction; simulation time reduction; CMOS technology; Circuit simulation; Coupling circuits; Frequency domain analysis; Integrated circuit interconnections; Parasitic capacitance; Poles and zeros; RLC circuits; Semiconductor device modeling; Voltage-controlled oscillators; Spice; Time Constant Equilibration Reduction (TICER); model order reduction; multi-port; passive; reduction efficiency; vector fitting (VF); voltage controlled oscillator (VCO);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Engineering & Systems, 2009. ICCES 2009. International Conference on
  • Conference_Location
    Cairo
  • Print_ISBN
    978-1-4244-5842-4
  • Electronic_ISBN
    978-1-4244-5843-1
  • Type

    conf

  • DOI
    10.1109/ICCES.2009.5383273
  • Filename
    5383273