DocumentCode
3148353
Title
Model order reduction of on-chip interconnects
Author
Medhat, Dina ; Hegazi, Emad ; Abdel-Rahman, Mohamed
Author_Institution
Mentor Graphics, Cairo, Egypt
fYear
2009
fDate
14-16 Dec. 2009
Firstpage
205
Lastpage
210
Abstract
In this paper, we describe a methodology for the efficient extraction and model order reduction of large on-chip interconnects. We propose a methodology that results in simulation time reduction by at least an order of magnitude, compared to commercial model order reduction software, by adopting frequency domain vector fitting to reduce the number of poles required to represent the interconnect. The proposed methodology supports multi-port order reduction while assuring passivity of the resulting reduced network. We verify the proposed methodology on an LC voltage controlled oscillator implemented in CMOS technology and extracting parasitic resistances, capacitances, and inductances. Moreover we verify the proposed methodology on a memory design.
Keywords
CMOS integrated circuits; RLC circuits; integrated circuit interconnections; network analysis; reduced order systems; voltage-controlled oscillators; CMOS technology; LC voltage controlled oscillator; capacitance extraction; frequency domain vector fitting; inductance; large on-chip interconnects; memory design; model order reduction; multi-port order reduction; parasitic resistance extraction; simulation time reduction; CMOS technology; Circuit simulation; Coupling circuits; Frequency domain analysis; Integrated circuit interconnections; Parasitic capacitance; Poles and zeros; RLC circuits; Semiconductor device modeling; Voltage-controlled oscillators; Spice; Time Constant Equilibration Reduction (TICER); model order reduction; multi-port; passive; reduction efficiency; vector fitting (VF); voltage controlled oscillator (VCO);
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Engineering & Systems, 2009. ICCES 2009. International Conference on
Conference_Location
Cairo
Print_ISBN
978-1-4244-5842-4
Electronic_ISBN
978-1-4244-5843-1
Type
conf
DOI
10.1109/ICCES.2009.5383273
Filename
5383273
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