DocumentCode
3148878
Title
Multi-lead ECG classification based on Independent Component Analysis and Support Vector Machine
Author
Shen, Mi ; Wang, Liping ; Zhu, Kanjie ; Zhu, Jiangchao
Author_Institution
Software Eng. Inst., East China Normal Univ., Shanghai, China
Volume
3
fYear
2010
fDate
16-18 Oct. 2010
Firstpage
960
Lastpage
964
Abstract
An novel multi-lead Electrocardiogram (ECG) classification method is proposed in this paper. At the feature extracting stage, an improved Independent Component Analysis (ICA) method is introduced. In our method, a heartbeat is intercepted into 3 segments (P wave, QRS interval, ST segment). ICA is used to extract the features of each segment separately. These three feature vectors construct the feature of single lead firstly. Then, twelve single lead feature vectors are combined to generate a multi-lead feature vector one by one. At last, the Support Vector Machine (SVM) is used for multi-classification and 2-classification experiments. All available data in MIT-BIH Arrhythmia Database and the number of 2500 practical data gathered from about 500 persons is used in experiments simultaneously. For MIT-BIH data, multi-classification result is discussed. The final average accuracy of the testing data is 98.18% and the average sensitivity is 98.68%. For practical data, 2-classification experiment result is discussed. The accuracy of testing data is 90.47% and the sensitivity is 90.01%.
Keywords
electrocardiography; feature extraction; independent component analysis; medical signal processing; signal classification; support vector machines; P wave; QRS interval; ST segment; electrocardiogram; feature extraction; heartbeat; independent component analysis; multilead ECG classification; support vector machine; Accuracy; Databases; Electrocardiography; Feature extraction; Heart beat; Support vector machines; Testing; Electrocardiogram; Independent Component Analysis; Multi-lead ECG classification; Support Vector Machine;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Engineering and Informatics (BMEI), 2010 3rd International Conference on
Conference_Location
Yantai
Print_ISBN
978-1-4244-6495-1
Type
conf
DOI
10.1109/BMEI.2010.5639841
Filename
5639841
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