• DocumentCode
    3151822
  • Title

    End-to-end error correction and online diagnosis for on-chip networks

  • Author

    Shamshiri, Saeed ; Ghofrani, AmirAli ; Cheng, Kwang-Ting

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA, USA
  • fYear
    2011
  • fDate
    20-22 Sept. 2011
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    We propose a comprehensive solution for end-to-end (e2e) error correction and online defect diagnosis for on-chip networks. For e2e error correction, we propose an interleaved error-locality-aware code that efficiently corrects both random and burst errors. We demonstrate that for 64-bit wide network links, interleaving four of the proposed code, 2G4L(26,16), each of which supports 16bit data, can correct as many as two random errors or 16 adjacent errors. In order to maintain the error correction capability of the Error Correcting Code (ECC) for transient and intermittent errors, we further propose an e2e data gathering and online diagnosis approach that locates the defective wires and replaces them with the spare wires embedded in the network. Our analytical and experimental studies show that under heavy noise, high escape rate, uncertainty about routing, and many other harmful effects, the diagnostic data collected by the proposed approach are accurate enough for the purpose of passive diagnosis.
  • Keywords
    error correction codes; fault diagnosis; microprocessor chips; network-on-chip; burst errors; data gathering; defective wires; end-to-end error correction; error correcting code; interleaved error-locality-aware code; on-chip networks; online defect diagnosis; passive diagnosis; random errors; spare wires; word length 64 bit; Decoding; Error correction; Error correction codes; Power demand; Reliability; System-on-a-chip; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2011 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4577-0153-5
  • Type

    conf

  • DOI
    10.1109/TEST.2011.6139156
  • Filename
    6139156