DocumentCode
3151967
Title
PATEGE: An Automatic DC Parametric Test Generation System for Series Gated ECL Circuits
Author
Ogihara, Takuji ; Saruyama, Shuichi ; Murai, Shinichi
Author_Institution
Mitsubishi Electric Corporation, Kamakura, Japan
fYear
1985
fDate
23-26 June 1985
Firstpage
212
Lastpage
218
Abstract
For ECL circuits, DC parametric tests such as input current (IIL, IIH), reference voltage (VBB), and power supply current (ICC) tests are executed as well as functional tests. This paper describes an automatic DC parametric test generation system PATEGE for the series gated ECL circuits. PATEGE can automatically generate the test patterns and calculate the expected values for IIL, IIH, VBB and ICC tests.
Keywords
Automatic test pattern generation; Automatic testing; Circuit testing; Current supplies; DC generators; Logic testing; Switches; System testing; Test pattern generators; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1985. 22nd Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0635-5
Type
conf
DOI
10.1109/DAC.1985.1585937
Filename
1585937
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