The susceptibility of the microprocessor-based relay of high voltage substations to EMP

Author

Zezhong, Wang ; Binxian, Lu ; Chengrong, Li ; Baoming, Xiao ; Cheng, Huang

Author_Institution

North China Electr. Power Univ., Beijing

Volume

1

fYear

2003

fDate

16-16 May 2003

Firstpage

517

Abstract

Based on the transient electric field measurement in the 500 kV substations, the authors measured the EMP susceptibility of a set of microprocessor-based protection relay of high voltage substations to electromagnetic field pulse (EMP). The results of measurement show that the field suppression effect of shielding box of protection relay and the ability of relay to resist interference like as EMP are enough to be compatible in the maximal transient switching electric field in substations

Keywords

electric variables measurement; electromagnetic interference; electromagnetic pulse; electromagnetic shielding; high-voltage engineering; microprocessor chips; relay protection; substation protection; 500 kV; EMP susceptibility; electromagnetic field pulse; field suppression effect; high voltage substations; interference resistance; maximal transient switching electric field; microprocessor-based protection relay; power substations; shielding box; transient electric field measurement; EMP radiation effects; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Electromagnetic transients; Protective relaying; Pulse measurements; Relays; Substation protection; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on

Conference_Location

Istanbul

Print_ISBN

0-7803-7779-6

Type

conf

DOI

10.1109/ICSMC2.2003.1428306

Filename

1428306