• DocumentCode
    3154909
  • Title

    Use of the Supscripted DALG in Submodule Testing with Applications in Cellular Arrays

  • Author

    Ladjadj, M. ; McDonald, J.F. ; Ho, D.-H. ; Murray, W., Jr.

  • Author_Institution
    Rensselaer Polytechnic Institute Center for Integrated Electronics, Troy, NY
  • fYear
    1986
  • fDate
    29-2 June 1986
  • Firstpage
    346
  • Lastpage
    353
  • Abstract
    This paper will introduce the concept of the Transparency cube in the extraction and testing of an embedded logic submodule. The algorithm presented can establish control of a submodule in a very small amount of CPU time, and it was found to perform extremely well when tested on cellular array topologies such as those which occur in systolic architectures. The program described detects if parts of a circuit are untestable and notifies the user as to where additional logic is necessary to make the circuit more transparent or testable. It also introduces controllability numbers for flexible signals (or subscripted D´s) and a method by which an Exclusive Or gate (EXOR) is handled as a single gate in the controllability calculations. This is useful since controllability numbers do not represent well the difficulties encountered with reconvergent fanout.
  • Keywords
    Circuit faults; Circuit testing; Circuit topology; Controllability; Electronic equipment testing; Flexible printed circuits; Logic arrays; Logic circuits; Logic testing; Packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1986. 23rd Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0702-5
  • Type

    conf

  • DOI
    10.1109/DAC.1986.1586111
  • Filename
    1586111