DocumentCode
3154909
Title
Use of the Supscripted DALG in Submodule Testing with Applications in Cellular Arrays
Author
Ladjadj, M. ; McDonald, J.F. ; Ho, D.-H. ; Murray, W., Jr.
Author_Institution
Rensselaer Polytechnic Institute Center for Integrated Electronics, Troy, NY
fYear
1986
fDate
29-2 June 1986
Firstpage
346
Lastpage
353
Abstract
This paper will introduce the concept of the Transparency cube in the extraction and testing of an embedded logic submodule. The algorithm presented can establish control of a submodule in a very small amount of CPU time, and it was found to perform extremely well when tested on cellular array topologies such as those which occur in systolic architectures. The program described detects if parts of a circuit are untestable and notifies the user as to where additional logic is necessary to make the circuit more transparent or testable. It also introduces controllability numbers for flexible signals (or subscripted D´s) and a method by which an Exclusive Or gate (EXOR) is handled as a single gate in the controllability calculations. This is useful since controllability numbers do not represent well the difficulties encountered with reconvergent fanout.
Keywords
Circuit faults; Circuit testing; Circuit topology; Controllability; Electronic equipment testing; Flexible printed circuits; Logic arrays; Logic circuits; Logic testing; Packaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1986. 23rd Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0702-5
Type
conf
DOI
10.1109/DAC.1986.1586111
Filename
1586111
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