DocumentCode
3155444
Title
Effectiveness of Heuristics Measures for Automatic Test Pattern Generation
Author
Patel, Surabhi ; Pate, Janak
Author_Institution
International Business Machines Corporation, Poughkeepsie, NY
fYear
1986
fDate
29-2 June 1986
Firstpage
547
Lastpage
552
Abstract
The PODEM (path-oriented decision making) algorithm generates tests for single stuck-at faults in combinational circuits described at the gate level. Controllability and observability (C/O) values were used as heuristic measures in PODEM. The PODEM algorithm and five different methods of determining controllability and observability were implemented. An experiment was conducted to study the effectiveness of different controllability and observability measures for PODEM. Based on the experimental data a new strategy for test generation is discussed.
Keywords
Automatic test pattern generation; Circuit faults; Circuit testing; Combinational circuits; Controllability; Decision making; Logic; Observability; Random number generation; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1986. 23rd Conference on
ISSN
0738-100X
Print_ISBN
0-8186-0702-5
Type
conf
DOI
10.1109/DAC.1986.1586141
Filename
1586141
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