• DocumentCode
    3157649
  • Title

    Preparation and characterization of manganese doped lead titanate films by sol-gel techniques

  • Author

    Tandon, R.P. ; Raman, V. ; Singh, Ramadhar ; Narula, Amarjeet K.

  • Author_Institution
    Nat. Phys. Lab., New Delhi, India
  • fYear
    1991
  • fDate
    33457
  • Firstpage
    443
  • Lastpage
    445
  • Abstract
    In the present investigation, sol-gel method has been adopted to make manganese doped lead titanate (PT) films with perovskite structure by reacting liquid precursors to form a sol. The films were deposited on stainless steel substrate by multilayer spin coating using technique. The films were then annealed at temperatures close to 550°C. The films were crack free and the ferroelectric behavior was established by studying their hysteresis loop measurements. Dielectric constant was found to be around 300 and coercive field was greater than 60 kv/cm for films with finer grain sizes. The films fired at 550°C exhibited remanent polarization values close to 25 micro-coulomb/cm2
  • Keywords
    dielectric hysteresis; dielectric polarisation; ferroelectric materials; ferroelectric thin films; grain size; lead compounds; manganese; permittivity; sol-gel processing; 550 C; PbTiO3:Mn; annealed; coercive field; crack free; dielectric constant; ferroelectric behavior; finer grain sizes; hysteresis loop; multilayer spin coating; perovskite structure; remanent polarization; sol-gel method; sol-gel techniques; stainless steel substrate; Annealing; Coatings; Dielectric substrates; Ferroelectric films; Ferroelectric materials; Manganese; Nonhomogeneous media; Steel; Temperature; Titanium compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
  • Conference_Location
    University Park, PA
  • Print_ISBN
    0-7803-1847-1
  • Type

    conf

  • DOI
    10.1109/ISAF.1994.522397
  • Filename
    522397