DocumentCode
3160724
Title
Identifications of Nanomechanical Properties of Cu-Sn Crystalline Phases
Author
Lai, Yi-Shao ; Yang, Ping-Feng ; Jian, Sheng-Rui
Author_Institution
Adv. Semicond. Eng., Inc., Kaohsiung
fYear
2007
fDate
10-12 Dec. 2007
Firstpage
105
Lastpage
108
Abstract
In this paper we report Young´s moduli and hardness of Cu6Sn5 and Cu3Sn intermetallic compounds (IMCs) measured by nanoindentation. The samples were prepared by annealing Sn-Cu diffusion couples. Indentations performed along the directions lateral and perpendicular to the IMC layers show statistically indistinguishable Young´s moduli and hardness for each of the two IMCs, implying that these polycrystalline IMC aggregates are rather isotropic. Nanomechanical responses of the IMCs were shown to depend greatly on the strain rate during loading while independent of the strain rate during unloading. Multiple pop-in events were observed for Cu6Sn5 during loading at a strain rate lower than about 0.1 s-1 to 0.5 s-1. Topographies of the residual impressions were quantitatively measured and the pile-up features were apparent for the two IMCs.
Keywords
Young´s modulus; annealing; copper alloys; electronics packaging; hardness; indentation; internal stresses; nanostructured materials; reliability; solders; tin alloys; Cu3Sn; Cu6Sn5; Young´s moduli; annealing; crystalline phases; electronic packaging reliability; hardness; intermetallic compounds; loading conditions; nanoindentation; nanomechanical properties; polycrystalline IMC aggregates; residual impressions; solder alloy; strain rate; Annealing; Capacitive sensors; Crystallization; Electronics packaging; Intermetallic; Materials science and technology; Phase measurement; Soldering; Temperature; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
Conference_Location
Singapore
Print_ISBN
978-1-4244-1323-2
Electronic_ISBN
978-1-4244-1323-2
Type
conf
DOI
10.1109/EPTC.2007.4469723
Filename
4469723
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