• DocumentCode
    3160724
  • Title

    Identifications of Nanomechanical Properties of Cu-Sn Crystalline Phases

  • Author

    Lai, Yi-Shao ; Yang, Ping-Feng ; Jian, Sheng-Rui

  • Author_Institution
    Adv. Semicond. Eng., Inc., Kaohsiung
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    105
  • Lastpage
    108
  • Abstract
    In this paper we report Young´s moduli and hardness of Cu6Sn5 and Cu3Sn intermetallic compounds (IMCs) measured by nanoindentation. The samples were prepared by annealing Sn-Cu diffusion couples. Indentations performed along the directions lateral and perpendicular to the IMC layers show statistically indistinguishable Young´s moduli and hardness for each of the two IMCs, implying that these polycrystalline IMC aggregates are rather isotropic. Nanomechanical responses of the IMCs were shown to depend greatly on the strain rate during loading while independent of the strain rate during unloading. Multiple pop-in events were observed for Cu6Sn5 during loading at a strain rate lower than about 0.1 s-1 to 0.5 s-1. Topographies of the residual impressions were quantitatively measured and the pile-up features were apparent for the two IMCs.
  • Keywords
    Young´s modulus; annealing; copper alloys; electronics packaging; hardness; indentation; internal stresses; nanostructured materials; reliability; solders; tin alloys; Cu3Sn; Cu6Sn5; Young´s moduli; annealing; crystalline phases; electronic packaging reliability; hardness; intermetallic compounds; loading conditions; nanoindentation; nanomechanical properties; polycrystalline IMC aggregates; residual impressions; solder alloy; strain rate; Annealing; Capacitive sensors; Crystallization; Electronics packaging; Intermetallic; Materials science and technology; Phase measurement; Soldering; Temperature; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1323-2
  • Electronic_ISBN
    978-1-4244-1323-2
  • Type

    conf

  • DOI
    10.1109/EPTC.2007.4469723
  • Filename
    4469723