• DocumentCode
    316090
  • Title

    A 3D, physically based compact model for IC VDMOS transistors

  • Author

    Victory, James ; McAndrew, Colin ; Thoma, Rainer

  • Author_Institution
    Motorola Inc., Geneva, Switzerland
  • Volume
    1
  • fYear
    1997
  • fDate
    14-17 Sep 1997
  • Firstpage
    399
  • Abstract
    A 3D VDMOS model has been derived and implemented in Pspice. The geometry dependent model includes accurate, scalable models for the gate-charge, including the voltage-varying gate-drain capacitance and the distributed effects of the buried layer and metal resistances on the total on-resistance of the device
  • Keywords
    SPICE; buried layers; capacitance; electric resistance; power MOSFET; semiconductor device models; 3D physically based compact model; Pspice; VDMOS transistors; accurate scalable models; buried layer; distributed effects; gate-charge; geometry dependent model; metal resistances; smart power ICs; total on-resistance; voltage-varying gate-drain capacitance; Capacitance; Displays; Fingers; Integrated circuit modeling; MOSFET circuits; Power MOSFET; Power control; SPICE; Semiconductor process modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 1997. Proceedings., 1997 21st International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    0-7803-3664-X
  • Type

    conf

  • DOI
    10.1109/ICMEL.1997.625278
  • Filename
    625278