• DocumentCode
    3161490
  • Title

    A novel low-cost pluggable chip scale package for high pin-count applications

  • Author

    Crane, S.W., Jr. ; Jeon, James ; Ogata, Charley ; Wang, Ton ; Cangellaris, Andreas ; Schutt-Aine, Jose

  • Author_Institution
    Silicon Bandwidth Inc., Fremont, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    69
  • Lastpage
    73
  • Abstract
    Advances in semiconductor design and fabrication are placing new demands on the engineering community to produce ever more sophisticated package solutions. As the voltage of devices falls, signal integrity issues assume an ever-greater role in the design decision tree. Furthermore, mechanical and thermal challenges often further complicate the designs, for they are moving to finer array sizes and yet increasing wattage. Finally, the semiconductors do not exist as entities unto themselves. They place design and fabrication constraints on the next level of packaging; typically a printed circuit board, already overcrowded and under extreme price pressure. This paper presents an innovative socketable package design that addresses the need for highly integrated packages that offer superior electrical performance at competitive cost. In particular, it is argued that, through careful design of the power and signal distribution through the package, high-density packaging with GHz bandwidth electrical performance is within reach
  • Keywords
    chip scale packaging; integrated circuit design; integrated circuit reliability; array sizes; design decision tree; electrical performance; fabrication constraints; high pin-count applications; pluggable chip scale package; signal distribution; signal integrity issues; socketable package design; Bandwidth; Chip scale packaging; Costs; Decision trees; Design engineering; Fabrication; Printed circuits; Semiconductor device packaging; Signal design; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.927690
  • Filename
    927690