• DocumentCode
    3161747
  • Title

    Package capacitors impact on microprocessor maximum operating frequency

  • Author

    Waizman, Alex ; Chung, Chee-Yee

  • Author_Institution
    MTM Center, Intel Israel, Haifa, Israel
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    118
  • Lastpage
    122
  • Abstract
    This paper discusses the behavior of microprocessor (CPU) maximum operating frequency (FMAX) under various conditions. In specific, the impact of voltage and temperature on the CPU FMAX for a gate delay dominated design vs. an RC-interconnect delay dominated design are described. As voltage tolerance is reduced through proper design placement of package capacitors, and using the optimal amount of capacitance and resistance (ESR) for the package capacitors, the CPU FMAX increases
  • Keywords
    capacitors; integrated circuit packaging; microprocessor chips; CPU FMAX; RC interconnect delay; design methodology; gate delay; maximum operating frequency; microprocessor; package capacitor; voltage tolerance; Algorithm design and analysis; Capacitance; Capacitors; Central Processing Unit; Delay effects; Design methodology; Frequency; Microprocessors; Packaging; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.927705
  • Filename
    927705