DocumentCode
3161747
Title
Package capacitors impact on microprocessor maximum operating frequency
Author
Waizman, Alex ; Chung, Chee-Yee
Author_Institution
MTM Center, Intel Israel, Haifa, Israel
fYear
2001
fDate
2001
Firstpage
118
Lastpage
122
Abstract
This paper discusses the behavior of microprocessor (CPU) maximum operating frequency (FMAX) under various conditions. In specific, the impact of voltage and temperature on the CPU FMAX for a gate delay dominated design vs. an RC-interconnect delay dominated design are described. As voltage tolerance is reduced through proper design placement of package capacitors, and using the optimal amount of capacitance and resistance (ESR) for the package capacitors, the CPU FMAX increases
Keywords
capacitors; integrated circuit packaging; microprocessor chips; CPU FMAX; RC interconnect delay; design methodology; gate delay; maximum operating frequency; microprocessor; package capacitor; voltage tolerance; Algorithm design and analysis; Capacitance; Capacitors; Central Processing Unit; Delay effects; Design methodology; Frequency; Microprocessors; Packaging; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location
Orlando, FL
ISSN
0569-5503
Print_ISBN
0-7803-7038-4
Type
conf
DOI
10.1109/ECTC.2001.927705
Filename
927705
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