DocumentCode
3161835
Title
Influence of a trace impurity on tin fixed point plateaus
Author
Petchpong, Patchariya ; Head, David I. ; Au, Joe Y H
Author_Institution
Adv. Manuf. & Enterprise Eng. Group, Brunel Univ., Uxbridge
fYear
2008
fDate
20-22 Aug. 2008
Firstpage
3155
Lastpage
3158
Abstract
The effect of trace cobalt impurity on the realisation of a high purity (99.9999%) tin fixed-point is presented. The aim is to improve the measurement of the temperature shift caused by low level impurity dopants, to test the interpolation of previous binary alloy systems obtained using relatively high levels of impurities. The experiments and results, described below, revealed the shift of the melting and freezing curves of an initially ldquopurerdquo tin cell by -0.71 mK/ppmw of cobalt, and confirmed the reproducibility of the temperature measurements in this fixed-point cell.
Keywords
cobalt; impurities; temperature measurement; tin alloys; binary alloy systems; dopants; temperature shift; thermometry; tin; trace cobalt impurity; Cobalt; Electrical resistance measurement; Impurities; Interpolation; Laboratories; Measurement standards; Platinum; Temperature measurement; Thermal resistance; Tin; International Temperature Scale of 1990 (ITS-90); Thermometry; Tin fixed-point temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE Annual Conference, 2008
Conference_Location
Tokyo
Print_ISBN
978-4-907764-30-2
Electronic_ISBN
978-4-907764-29-6
Type
conf
DOI
10.1109/SICE.2008.4655208
Filename
4655208
Link To Document