DocumentCode
3161858
Title
Viscosity of a no-flow underfill during reflow and its relationship to solder wetting
Author
Morganelli, Paul ; Wheelock, Brian
Author_Institution
Emerson & Cuming, Billerica, MA, USA
fYear
2001
fDate
2001
Firstpage
163
Lastpage
166
Abstract
There is much interest in understanding viscosity changes of a no-flow underfill during reflow. Viscosity changes that result from the onset of cure provide resistance to the formation of solder interconnections, and can result in a decrease in yield. The difficulty has been tracking viscosity changes during temperature profiles that vary as much as 4 degrees/second. We used microdielectrometry to make real-time ion viscosity measurements of various no-flow underfill formulations during a standard reflow temperature profile. The results clearly show the initial viscosity drop as temperature ramps up, and the point at which the effect of cure dominates and causes viscosity to rise. The data are related to DSC analysis and to solder joint yield. Overall, the results show how viscosity changes during the reflow process can potentially have a dramatic effect on assembly yield rates. The information gained is useful for developing a reflow process to form reliable solder joints
Keywords
differential scanning calorimetry; encapsulation; reflow soldering; viscosity; DSC analysis; assembly yield rates; microdielectrometry; no-flow underfill; real-time ion viscosity measurements; reflow; solder joint yield; solder wetting; temperature profiles; viscosity changes; Assembly; Chemical processes; Curing; Dielectric loss measurement; Electrodes; Monitoring; Resins; Soldering; Temperature dependence; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location
Orlando, FL
ISSN
0569-5503
Print_ISBN
0-7803-7038-4
Type
conf
DOI
10.1109/ECTC.2001.927712
Filename
927712
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