• DocumentCode
    3162315
  • Title

    A Novel Fabrication Technology for Waferlevel Vacuum Packaged Microscanning Mirrors

  • Author

    Oldsen, Marten ; Hofmann, Ulrich ; Quenzer, Hans-Joachim ; Wagner, Bernd

  • Author_Institution
    Fraunhofer Inst. for Silicon Technol., Itzehoe
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    303
  • Lastpage
    307
  • Abstract
    This paper presents a novel fabrication technology for wafer level hermetic encapsulated MEMS micro scanning mirrors. This wafer level package enables vacuum operation of the electrostatically driven resonant scanners reducing the required driving voltage and enhancing the mechanical deflection angle even at resonance frequencies of more than 100 kHz. Two nearly independently structured 30 microns thick epipoly silicon layers offer a high design variability due to the possibility to create active silicon structures with two different thicknesses. A buried isolated interconnection layer between the two thick epipoly silicon layers enables the fabrication of lateral feedthroughs which are vital to set up a hermetic package. A structured glass wafer with up to 900 microns deep cavities seals the device wafer at the front side via anodic bonding. An AuSi-eutectic bonded silicon wafer completes the wafer scale vacuum packaging process.
  • Keywords
    gold compounds; micromirrors; silicon compounds; wafer level packaging; AuSi; MEMS; buried isolated interconnection layer; epipoly silicon layers; fabrication technology; hermetic package; mechanical deflection angle; resonant scanners; silicon structures; wafer scale vacuum packaging process; waferlevel vacuum packaged microscanning mirrors; Fabrication; Micromechanical devices; Mirrors; Packaging; Resonance; Silicon; Vacuum technology; Voltage; Wafer bonding; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1323-2
  • Electronic_ISBN
    978-1-4244-1323-2
  • Type

    conf

  • DOI
    10.1109/EPTC.2007.4469809
  • Filename
    4469809