DocumentCode
3162315
Title
A Novel Fabrication Technology for Waferlevel Vacuum Packaged Microscanning Mirrors
Author
Oldsen, Marten ; Hofmann, Ulrich ; Quenzer, Hans-Joachim ; Wagner, Bernd
Author_Institution
Fraunhofer Inst. for Silicon Technol., Itzehoe
fYear
2007
fDate
10-12 Dec. 2007
Firstpage
303
Lastpage
307
Abstract
This paper presents a novel fabrication technology for wafer level hermetic encapsulated MEMS micro scanning mirrors. This wafer level package enables vacuum operation of the electrostatically driven resonant scanners reducing the required driving voltage and enhancing the mechanical deflection angle even at resonance frequencies of more than 100 kHz. Two nearly independently structured 30 microns thick epipoly silicon layers offer a high design variability due to the possibility to create active silicon structures with two different thicknesses. A buried isolated interconnection layer between the two thick epipoly silicon layers enables the fabrication of lateral feedthroughs which are vital to set up a hermetic package. A structured glass wafer with up to 900 microns deep cavities seals the device wafer at the front side via anodic bonding. An AuSi-eutectic bonded silicon wafer completes the wafer scale vacuum packaging process.
Keywords
gold compounds; micromirrors; silicon compounds; wafer level packaging; AuSi; MEMS; buried isolated interconnection layer; epipoly silicon layers; fabrication technology; hermetic package; mechanical deflection angle; resonant scanners; silicon structures; wafer scale vacuum packaging process; waferlevel vacuum packaged microscanning mirrors; Fabrication; Micromechanical devices; Mirrors; Packaging; Resonance; Silicon; Vacuum technology; Voltage; Wafer bonding; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
Conference_Location
Singapore
Print_ISBN
978-1-4244-1323-2
Electronic_ISBN
978-1-4244-1323-2
Type
conf
DOI
10.1109/EPTC.2007.4469809
Filename
4469809
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