• DocumentCode
    3162316
  • Title

    Degradation behavior of Ca-doped barium titanate ceramic capacitors

  • Author

    Huh, Min ; Cho, Kyeong Ho ; Nam, Hyo-Duk ; Lee, Hee Young

  • Author_Institution
    Dept. of Electron. Eng., Yeungnam Univ., Kyongsan, South Korea
  • fYear
    1991
  • fDate
    33457
  • Firstpage
    572
  • Lastpage
    576
  • Abstract
    Electrical degradation of calcium-containing MLCCs having nickel internal electrode was studied using a highly accelerated life test set-up. Both extrinsic and intrinsic failures were identified in commercial MLCCs. From the estimated values of degradation parameters such as voltage exponent factor and pseudo-activation energy, it was found that the intrinsic failure took place by thermal runaway. Although, the degradation pattern for nickel electrode MLCCs was similar to that for common palladium electrode MLCCs, the maximum rated lifetime of the former was in the range of 5 to 30 years and was, in general, shorter than that of the latter. This difference was ascribed to the difference in oxygen vacancy concentrations. Thus, possible degradation mechanisms should be related to oxygen vacancy movement. Among them are reduction model, grain boundary barrier model and de-mixing model
  • Keywords
    barium compounds; calcium; ceramic capacitors; electron device testing; failure analysis; ferroelectric capacitors; grain boundary diffusion; life testing; nickel; vacancies (crystal); 5 to 30 y; BaTiO3:Ca-Ni; Ca-doped barium titanate ceramic capacitors; accelerated life test; calcium-containing MLCC; de-mixing model; degradation behavior; electrical degradation; extrinsic failure; grain boundary barrier model; intrinsic failure; maximum rated lifetime; nickel internal electrode; oxygen vacancy concentrations; pseudo-activation energy; reduction model; thermal runaway; voltage exponent factor; Barium; Capacitors; Ceramics; Electrodes; Life estimation; Life testing; Nickel; Thermal degradation; Titanium compounds; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
  • Conference_Location
    University Park, PA
  • Print_ISBN
    0-7803-1847-1
  • Type

    conf

  • DOI
    10.1109/ISAF.1994.522433
  • Filename
    522433