• DocumentCode
    3162384
  • Title

    Radiated electromagnetic field signature of faulty and polluted porcelain insulators

  • Author

    Azordegan, Ehsan ; Kordi, Behzad ; Swatek, David R.

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Manitoba, Winnipeg, MB, Canada
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    449
  • Lastpage
    452
  • Abstract
    Porcelain cap and pin insulators are by far the most popular suspension insulators in high-voltage distribution networks all around the world. Inspection and condition monitoring of HV insulators is also a very hot research topic because of the critical and vital role that they play in distribution systems. A new condition assessment method based on electromagnetic radiations from porcelain insulators is presented. In a lab environment, a 45 KV transformer is connected to a string of two porcelain insulators. Electromagnetic radiations from the insulators are captured by different receivers. A polluted insulator and a cracked insulator were studied as a faulty insulator on the string. Pollution is artificially added to the surface of the insulator and another insulator was intentionally cracked for the tests. The electromagnetic radiated signature of a polluted insulator and a cracked insulator was captured and analyzed and a comparison between them is also presented.
  • Keywords
    electromagnetic waves; insulator contamination; porcelain insulators; power transformers; HV insulators; condition assessment method; condition monitoring; cracked insulator; faulty porcelain insulators; high-voltage distribution networks; inspection; lab environment; pin insulators; polluted porcelain insulators; porcelain cap; radiated electromagnetic field signature; suspension insulators; transformer; voltage 45 kV; Electric fields; Electromagnetic radiation; Insulators; Oscilloscopes; Partial discharges; Porcelain; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application (ICHVE), 2010 International Conference on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-8283-2
  • Type

    conf

  • DOI
    10.1109/ICHVE.2010.5640731
  • Filename
    5640731