DocumentCode
3163212
Title
Ring Oscillator Structure For realistic Dynamic Stress Of MOSFETS And Interconnects
Author
Winnerl, J. ; Neppl, F. ; Lill, A. ; Röska, G. ; Zatisch, W.
Author_Institution
Siemens Ag
fYear
1988
fDate
22-23 Feb. 1988
Firstpage
56
Lastpage
60
Keywords
Circuit testing; Degradation; Hot carriers; Life testing; MOSFETs; Pulse circuits; Pulsed power supplies; Ring oscillators; Stress; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location
Long Beach, CA, USA
Type
conf
DOI
10.1109/ICMTS.1988.672929
Filename
672929
Link To Document