DocumentCode
3163218
Title
Reliability study and failure analysis of fine pitch solder bumped flip chip on low-cost printed circuit board substrate
Author
Xiao, Guo-Wei ; Chan, Philip C.H. ; Teng, Annette ; Lee, Ricky S W ; Yuen, Matthew M F
Author_Institution
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
fYear
2001
fDate
2001
Firstpage
598
Lastpage
605
Abstract
The design and proper selection of low-cost printed circuit board (PCB) is essential to the reliability and formation of solder joints for the fine-pitch solder-bumped flip-chip on board (FCOB) technology. By nature low-cost PCBs don´t have the precision in patterns like the fine-pitch solder-bumped flip-chip technology. In this study, eutectic solder bumps (63Sn/37Pb) were electroplated on the test-chips with various pad pitches and chip sizes. Several types of low-cost PCB designs were evaluated for the fine-pitch solder-bumped flip-chip. The effects of different PCB designs on the formation and shapes of solder joints were studied. The location and formation of voids in the underfill depend on the design and properties of the PCB. The alignment accuracy of the solder mask opening area and the copper pad on the PCB is very critical for the reliability of FCOB technology. The acceptable mis-registration on the low-cost PCB decreases as the chip size increases. Scanning acoustic microscope (SAM), X-ray imaging system, cross-sectioning, scanning electron microscopy (SEM) were used to evaluate and inspect the samples after the thermal cycling test and temperature-humidity test. The solder joint failure modes after thermal tests were studied
Keywords
failure analysis; fine-pitch technology; flip-chip devices; printed circuit manufacture; reliability; soldering; Cu; Sn-Pb; X-ray imaging; copper pad; cross-sectioning; electronic packaging; electroplated eutectic solder bump; failure analysis; fine-pitch flip-chip-on-board technology; printed circuit board substrate; reliability; scanning acoustic microscopy; scanning electron microscopy; temperature-humidity testing; thermal cycling; underfill void; Acoustic testing; Bonding; Electronic packaging thermal management; Failure analysis; Flip chip; Printed circuits; Scanning electron microscopy; Silicon; Soldering; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location
Orlando, FL
ISSN
0569-5503
Print_ISBN
0-7803-7038-4
Type
conf
DOI
10.1109/ECTC.2001.927790
Filename
927790
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