• DocumentCode
    3163458
  • Title

    Defect Diagnostic Matrix -a Defect Learning Vehicle For Submicron Technologies

  • Author

    Newhart, Ronald E. ; Sprogis, Edmund J.

  • Author_Institution
    Ibm General Technology Division
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    103
  • Lastpage
    106
  • Keywords
    Circuit testing; Conductors; Decoding; Distributed decision making; Isolation technology; Logic; Monitoring; Pattern recognition; Vehicles; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672943
  • Filename
    672943
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3163458