• DocumentCode
    3163529
  • Title

    Error modeling and improved position estimation for optical incremental encoders by means of time stamping

  • Author

    Merry, Roel ; Van de Molengraft, René ; Steinbuch, Maarten

  • Author_Institution
    Tech. Univ. Eindhoven, Eindhoven
  • fYear
    2007
  • fDate
    9-13 July 2007
  • Firstpage
    3570
  • Lastpage
    3575
  • Abstract
    Optical incremental encoders are extensively used for position measurements in motion systems. The number of slits on the encoder disk defines the resolution of the encoder and bounds the accuracy of the position measurement. The encoder position measurements suffer from quantization errors. Moreover, encoder imperfections occur due to manufacturing tolerances. In this paper a method, which is based on time stamping, is proposed to obtain more accurate position and velocity estimations. Time stamping makes use of stored events, consisting of the encoder counts and their time instants, which are captured at a high resolution clock. Low order polynomial fitting through these encoder events is combined with active compensation of the encoder errors. The proposed method is applied in real-time experiments to a motion system. The results show an improvement in the position accuracy of up to 87% in terms of the maximum error. The estimated velocity is also much more accurate than the differentiated quantized encoder output signal.
  • Keywords
    compensation; encoding; motion control; polynomials; position control; position measurement; quantisation (signal); velocity control; velocity measurement; active compensation; encoder position measurements; error modeling; low order polynomial fitting; manufacturing tolerances; motion control systems; optical incremental encoders; quantization errors; time stamping; velocity estimations; Counting circuits; Motion control; Optical signal processing; Polynomials; Position measurement; Quantization; Sampling methods; Signal processing; Switches; Velocity control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2007. ACC '07
  • Conference_Location
    New York, NY
  • ISSN
    0743-1619
  • Print_ISBN
    1-4244-0988-8
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2007.4282443
  • Filename
    4282443