Characterization Accuracy of High-Q Reactors Using Broadband Reflection/Transmission Measurement Techniques

Author

Deleniv, A. ; Gevorgian, S.

Author_Institution

Dept. of Microtechnology & Nanoscience, Chalmers Univ. of Technol., Goteborg

fYear

2006

fDate

10-15 Sept. 2006

Firstpage

975

Lastpage

978

Abstract

Characterization accuracy of high-Q reactors due to measurement uncertainties is analyzed in this paper. Two broadband techniques based on reflection and transmission type measurements are considered. A differential calculus combined with an equivalent circuit representation of the measurement error are used here to derive simple analytic formulas. It is shown that the accuracy of calibrated VNA is insufficient to obtain accurate loss data. A measurement procedure is proposed that improves the accuracy of loss measurement. A measurement example is given demonstrating the utility of the above approach

Keywords

Q-factor; capacitors; equivalent circuits; inductors; loss measurement; measurement errors; measurement uncertainty; microwave measurement; network analysers; broadband reflection measurement; broadband transmission measurement; differential calculus; equivalent circuit representation; high-Q reactors; loss measurement; measurement error; measurement uncertainties; vector network analyzer; Admittance measurement; Capacitance measurement; Equivalent circuits; Inductors; Loss measurement; Measurement errors; Measurement techniques; Measurement uncertainty; Microwave theory and techniques; Reflection;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2006. 36th European

Conference_Location

Manchester

Print_ISBN

2-9600551-6-0

Type

conf

DOI

10.1109/EUMC.2006.281085

Filename

4057984