• DocumentCode
    3164065
  • Title

    Design and Simulation of RF-CMOS Spiral Inductors for ISM Band RFID Reader Circuits

  • Author

    Uddin, M.J. ; Nordin, A.N. ; Ibrahimy, M.I. ; Reaz, M.B.I. ; Zulkifli, T.Z.A. ; Hasan, M.A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Int. Islamic Univ. Malaysia, Kuala Lumpur
  • fYear
    2009
  • fDate
    3-3 April 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The recent popularity of RFID tags has generated research for accompanying miniature, low-power reader circuits. This work illustrates the design of RF complementary metal- oxide-semiconductor (CMOS) process compatible spiral inductors. Several simulators such as AWR Microwave Officereg, SONNETreg, and finite element program CST were used to provide its S21 and S31 transmission characteristics, approximate and finalized design layout values respectively. This design utilized Silterra 0.18 mum RF-CMOS technology process parameters. Simulation results indicate that inductors core diameters must be adequately large (more than 100 mum) to ensure high quality factor characteristics and its conductor spacing should be minimal to obtain larger per unit area inductive value. The proposed design methodology optimizes the conductor width of inductors to allow alignment of the peak quality factor with the circuit´s operating frequency, thereby enhancing the input/output matching characteristics and S-parameter extraction in the GHz region.
  • Keywords
    CMOS integrated circuits; Q-factor; S-parameters; inductors; radiofrequency identification; radiofrequency integrated circuits; ISM band RFID reader circuit; RF-CMOS spiral inductor; S-parameter extraction; Silterra 0.18 mum RF-CMOS technology process; inductor core diameter; quality factor characteristics; size 0.18 mum; CMOS process; Circuit simulation; Conductors; Finite element methods; Inductors; Q factor; RFID tags; Radio frequency; Radiofrequency identification; Spirals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Electron Devices, 2009. WMED 2009. IEEE Workshop on
  • Conference_Location
    Boise, ID
  • Print_ISBN
    978-1-4244-3551-7
  • Electronic_ISBN
    978-1-4244-3552-4
  • Type

    conf

  • DOI
    10.1109/WMED.2009.4816153
  • Filename
    4816153