Fully Functional "Real Time" Non-Linear Device Characterization System Incorporating Active Load Control

This paper demonstrates, for the first time, a fully functional "real time" large signal characterization system; achieved by successful integration of a large signal multi-tone waveform measurement system with active load-pull based on the envelope load-pull principle. This approach allows for the utilization of slowly modulated signals to provide rapid and improved large signal device characterization capabilities. For example, the power amplifier is a key component in many systems; the successful design of which is reliant on the availability of comprehensive non-linear measurement data of the transistors utilized. Unfortunately, non-linear device measurements are both complex and generally very time consuming to perform, hence design is often based on a limited data set. Performing non-linear measurements under slowly modulated conditions could considerably speedup the measurement of non-linear device performance. However, to date these measurements approaches have only been possible in passive load-pull systems. The solution presented here overcomes this major limitation. A number of measurements are demonstrated showing both the present utilization and future potential of this approach to rapidly provide the comprehensive measurement data sets needed for accurate, cost and time efficient power amplifier design