• DocumentCode
    3170637
  • Title

    Electrically-induced shape changes in cement-based materials

  • Author

    Ai, Hua ; Li, Jie-Fang ; Viehland, Dwight

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    1991
  • fDate
    33457
  • Firstpage
    760
  • Lastpage
    761
  • Abstract
    The electromechanical behavior of hardened portland cement paste has been investigated as a function of measurement frequency and DC electrical bias using an interferometric technique. Large field induced shape changes on the order of 100 A have been found in millimeter thick specimens exposed to moisture. In addition, strong hysteresis effects were found on cycling a large AC field. Dry samples were found to exhibit no field-induced deformations. The mechanism underlying this anomalous behavior is believed to be an electro-osmotically induced swelling of the pore structures. Evidence in support of this hypothesis was found by corresponding investigations of porous silica gels
  • Keywords
    cements (building materials); deformation; electromechanical effects; hysteresis; light interferometry; moisture; osmosis; piezoelectricity; porous materials; swelling; DC electrical bias; cement-based materials; cycling; electrically-induced shape changes; electro-osmotically induced swelling; electromechanical behavior; field-induced deformations; hardened portland cement paste; hysteresis effects; interferometric technique; large AC field; measurement frequency; mechanism; millimeter thick specimens; moisture; piezoelectric measurements; pore structures; porous silica gels; Atmospheric measurements; Building materials; Capacitive sensors; Humidity; Hysteresis; Optical interferometry; Plugs; Shape; Silicon compounds; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
  • Conference_Location
    University Park, PA
  • Print_ISBN
    0-7803-1847-1
  • Type

    conf

  • DOI
    10.1109/ISAF.1994.522482
  • Filename
    522482