• DocumentCode
    3174464
  • Title

    Concurrent projection to latent structures for output-relevant and input-relevant fault monitoring

  • Author

    Qin, S. Jeo ; Yingying Zheng

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Firstpage
    7018
  • Lastpage
    7023
  • Abstract
    When process faults occur, the process condition changes which is reflected in process variables. If these ab-normal variations are not properly annihilated in the process, poor product quality occurs as a consequence. This paper proposes a new concurrent projection to latent structures for the monitoring of output-relevant faults that affect the quality and input-relevant process faults that should be alarmed as well. The input and output data spaces are concurrently projected to five subspaces, a joint input-output subspace that captures covariations between input and output, an output-principal subspace, an output-residual subspace, an input-principal subspace, and an input-residual subspace. Process fault detection indices are developed based on the partition of subspaces for various types of fault detection alarms. The proposed monitoring method offers complete monitoring of faults that happen in the predictable output subspace and the unpredictable output residual subspace, as well as faults that affect the input spaces and could be incipient for the output. Numerical simulation examples are given to illustrate the effectiveness of the proposed methods.
  • Keywords
    fault diagnosis; quality management; statistical analysis; concurrent projection; input-relevant fault monitoring; latent structures; output-relevant fault monitoring; process fault detection indices; Data models; Educational institutions; Fault detection; Monitoring; Principal component analysis; USA Councils; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control (CDC), 2012 IEEE 51st Annual Conference on
  • Conference_Location
    Maui, HI
  • ISSN
    0743-1546
  • Print_ISBN
    978-1-4673-2065-8
  • Electronic_ISBN
    0743-1546
  • Type

    conf

  • DOI
    10.1109/CDC.2012.6426571
  • Filename
    6426571