• DocumentCode
    3175878
  • Title

    Electrolytic capacitor life testing and prediction

  • Author

    Sankaran, V.A. ; Rees, F.L. ; Avant, C.S.

  • Author_Institution
    Res. Lab., Ford Motor Co., Dearborn, MI, USA
  • Volume
    2
  • fYear
    1997
  • fDate
    5-9 Oct 1997
  • Firstpage
    1058
  • Abstract
    The aluminum electrolytic capacitor is widely used in various power electronic circuits and systems such as 3-phase PWM inverters. Its functions include, bus voltage stabilisation, conduction of ripple current due to switching events, etc. In automotive applications, one of the big issues is the extreme and harsh temperatures they have to withstand, underhood, which during the summer months would reduce their life. Most of the capacitors have maximum temperature ratings of either 85 or 105°C and a few are rated at 125°C. According to literature found, one of the primary wear-out mechanisms in electrolytic capacitors is mainly due to the loss of electrolyte by vapor diffusion through the seals. Other reports suggest that the main wearout mechanism is deterioration of the electrolyte. Experiments conducted to date and the results from the same are compared against modeling results based on a model reported in literature
  • Keywords
    PWM invertors; diffusion; electrolytes; electrolytic capacitors; life testing; losses; 3-phase PWM inverters; 85 to 125 C; automotive applications; bus voltage stabilisation; electrolyte loss; electrolytic capacitor life prediction; electrolytic capacitor life testing; equivalent series internal resistance; maximum temperature ratings; power electronic circuits; ripple current conduction; seals; switching events; vapor diffusion; wear-out mechanisms; Adders; Aluminum; Automotive applications; Circuits and systems; Life testing; Power electronics; Pulse width modulation inverters; Switched capacitor circuits; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE
  • Conference_Location
    New Orleans, LA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4067-1
  • Type

    conf

  • DOI
    10.1109/IAS.1997.628992
  • Filename
    628992