DocumentCode
3176812
Title
Perspectives on shallow junction technology from the viewpoint of the ITRS
Author
Larson, L.A.
Author_Institution
Int. SEMATECH, Austin, TX, USA
fYear
2000
fDate
6-6 Dec. 2000
Firstpage
7
Lastpage
11
Abstract
The grand challenges to the semiconductor industry in continuing the scaling of planar CMOS devices are described in the International Technology Roadmap for Semiconductors. One of these challenges is the requirement for the continuing reduction of the junction depth of shallow junctions such as the drain extension. The key potential solutions to this challenge involve the continued development of doping and annealing technologies. This paper describes the challenges and the potential solutions of the ITRS. The potential solutions figure describes much of the efforts of the industry. Each of the key elements of this figure is described. This is reviewed in the context of the highest level advantages and issues associated with each particular technology.
Keywords
CMOS integrated circuits; annealing; doping profiles; integrated circuit design; semiconductor doping; ITRS; International Technology Roadmap for Semiconductors; annealing technology; doping technology; drain extension; junction depth; planar CMOS device scaling; semiconductor industry; shallow junction technology; shallow junctions; Annealing; CMOS technology; Conductivity; Electronics industry; Implants; Ion implantation; Microprocessors; Production; Semiconductor device doping; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Junction Technology, 2000, The first international workshop on, Extended abstracts of
Conference_Location
Makuhari, Japan
Print_ISBN
4-89114-008-9
Type
conf
DOI
10.1109/IWIT.2000.928769
Filename
928769
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