• DocumentCode
    3176812
  • Title

    Perspectives on shallow junction technology from the viewpoint of the ITRS

  • Author

    Larson, L.A.

  • Author_Institution
    Int. SEMATECH, Austin, TX, USA
  • fYear
    2000
  • fDate
    6-6 Dec. 2000
  • Firstpage
    7
  • Lastpage
    11
  • Abstract
    The grand challenges to the semiconductor industry in continuing the scaling of planar CMOS devices are described in the International Technology Roadmap for Semiconductors. One of these challenges is the requirement for the continuing reduction of the junction depth of shallow junctions such as the drain extension. The key potential solutions to this challenge involve the continued development of doping and annealing technologies. This paper describes the challenges and the potential solutions of the ITRS. The potential solutions figure describes much of the efforts of the industry. Each of the key elements of this figure is described. This is reviewed in the context of the highest level advantages and issues associated with each particular technology.
  • Keywords
    CMOS integrated circuits; annealing; doping profiles; integrated circuit design; semiconductor doping; ITRS; International Technology Roadmap for Semiconductors; annealing technology; doping technology; drain extension; junction depth; planar CMOS device scaling; semiconductor industry; shallow junction technology; shallow junctions; Annealing; CMOS technology; Conductivity; Electronics industry; Implants; Ion implantation; Microprocessors; Production; Semiconductor device doping; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Junction Technology, 2000, The first international workshop on, Extended abstracts of
  • Conference_Location
    Makuhari, Japan
  • Print_ISBN
    4-89114-008-9
  • Type

    conf

  • DOI
    10.1109/IWIT.2000.928769
  • Filename
    928769