Accurate analysis of substrate sensitivity of active transistors in an analog circuit

Author

Takaya, Satoshi ; Bando, Yoji ; Ohkawa, Takeshi ; Takaramoto, T. ; Yamada, Tomoaki ; Souda, Masaaki ; Kumashiro, S. ; Mogami, Tohru ; Nagata, Makoto

Author_Institution

Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan

fYear

2011

fDate

14-16 March 2011

Firstpage

1

Lastpage

6

Abstract

A substrate network tailored for a variety of transistor geometry including channel sizes, fingering and folding, and shapes and placements of guard bands, extends the capability and accuracy of full-chip noise coupling analysis of mixed technology VLSI integration. Analysis of substrate sensitivity of differential amplifiers in a 90 nm CMOS technology with more than 64 different geometry and operating conditions well agrees with on-chip substrate coupling measurements, with the discrepancy within 3 dB.

Keywords

CMOS analogue integrated circuits; VLSI; differential amplifiers; mixed analogue-digital integrated circuits; sensitivity; transistor circuits; CMOS technology; active transistor; analog circuit; differential amplifier; full-chip noise coupling analysis; mixed technology VLSI integration; on-chip substrate coupling measurement; size 90 nm; substrate sensitivity; Analog circuits; Couplings; Noise; Sensitivity; Silicon; Substrates; Transistors; mixedsignal VLSI circuit; on-chip noise monitoring; substrate crosstalk;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality Electronic Design (ISQED), 2011 12th International Symposium on

Conference_Location

Santa Clara, CA

ISSN

1948-3287

Print_ISBN

978-1-61284-913-3

Type

conf

DOI

10.1109/ISQED.2011.5770703

Filename

5770703