• DocumentCode
    3177428
  • Title

    Effective algorithm for integrating clock gating and power gating to reduce dynamic and active leakage power simultaneously

  • Author

    Li, Li ; Choi, Ken ; Nan, Haiqing

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Clock gating and power gating are the two most widely used techniques to reduce dynamic power and leakage power respectively. It is desired that these two techniques can be integrated. In this paper, activity-driven optimized bus specific clock gating (OBSC) is applied to reduce dynamic power, and the enable signal generated by OBSC is used as the sleep signal for power gating. The power gated cells are determined by a proposed forward traversing algorithm. Moreover, minimum idle time concept is used to determine if the insertion of power gating will gain energy reduction. In order to evaluate our technique, ISCAS´89 circuits have been experimented. The simulation results prove that 25.07% dynamic power can be reduced by OBSC, and 45.12% active leakage power can be saved by power gating.
  • Keywords
    CMOS digital integrated circuits; clocks; electrical faults; integrated circuit design; active leakage power reduction; activity driven optimized bus specific clock gating; dynamic leakage power reduction; forward traversing algorithm; minimum idle time concept; power gating; sleep signal; CMOS integrated circuits; Clocks; Estimation; Heuristic algorithms; Logic gates; Power demand; Registers; Clock gating; forward traversing; low power; power gating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2011 12th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-61284-913-3
  • Type

    conf

  • DOI
    10.1109/ISQED.2011.5770706
  • Filename
    5770706