Schlieren interferometry as a laser materials processing diagnostic tool

The schlieren interferometry is a powerful tool when used in materials laser radiation processing, allowing a better understanding of related thermal phenomena on the sample. However, it is observed that, when refractive index gradients became too high, the method reaches to its applicability limit, no longer behaving as a schlieren interferometer. It is expected that the use of deflection diagnostic techniques and Mie scattering visualization can complement this method, overcoming their limitations.